Apparatus for testing circuit packages

ABSTRACT

Apparatus for testing circuit packages including a test sequence generator which is connected to a contactor for making contact to the leads of a circuit package. The contactor includes an inclined track for slidably receiving integrated circuit packages, and circuit package storage tubes connected to the ends of the inclined track. The contactor has a test region at which a circuit package is held by a rocker member. Contact means having a plurality of fingers is operated to make contact with the leads of an integrated circuit package in the test region. A test sequence may then be conducted. After the test sequence the rocker member is operated to release the integrated circuit package which has just been tested from the test region. Another circuit package then moves into the test region and the testing sequence is initiated again.

United States Patent Isaac et al.

[4 1 Oct. 24, 1972 [54] APPARATUS FOR TESTING CIRCUIT PACKAGES SigneticsCorporation, Sunnyvale, Calif.

Filed: Nov. 27, 1970 Appl. No.: 93,322

[73] Assignee:

[52] US. Cl. ..324/158 F, 209/73 [51] [58] Field of Search ..324/158 F,158 P, 158 R, 73

References Cited UNITED STATES PATENTS Int. Cl. ..G01r 31/22, B07c 5/344Primary Examiner-Rudolph V. Rolinec Assistant Examiner-Ernest F. KarlsenAttorney-Flehr, Hohbach, Test, Albritton' & Herbert ABSTRACT Apparatusfor testing circuit packages including a test sequence generator whichis connected toa contactor for making contact to the leads of a circuitpackage. The contactor includes an inclined track for slidably receivingintegrated circuit packages, and circuit package storage tubes connectedto the ends of the inclined track. The contactor has a test region atwhich a circuit package is held by a rocker member. Contact means havinga plurality of fingers is operated to make contact with the leads of anintegrated circuit package in the test region. A test sequence may thenbe conducted. After the test sequence the rocker member is operated torelease the integrated circuit package which has just been tested fromthe test region. Another circuit package then moves into the test regionand the testing sequence is initiated again.

7 Claims, 11 Drawing Figures PATENTQD I973 v 3.701.021

sum 1 or 4 wwwraes 65024! 4, [5444 Emma F. (waver Jaxw 6. 5004: 2y 54k,Mat, M W lrrallvlri APPARATUS FOR TESTING cmcurr PACKAGES BACKGROUND OFTHE INVENTION This invention pertains to apparatus for the testing ofintegratedcircuit and more particularly relates to an automaticcontactor for facilitating testing of the electrical properties of acircuit package.

The use of integrated circuits has mushroomed since their introduction.However, the small size of integrated circuits and their sensitivity toelectrical disturbances present manufacturing and handling problems.Although the manufacturing yield of usable integrated circuits has beensteadily increased as new and better manufacturing methods have beendeveloped, it is still desirable to test all or at least a significantportion of the integrated circuits which are produced in order'to verifythat they exhibit the proper electrical characteristics for the uses forwhich they are intended. An e'fficient way of testing the circuitpackages is by connecting their leads to a small computer or testsequence generator which is programmed to run through a series of testssuch as applying voltages to certain terminals and observing outputs onother terminals.

Because of their small size and the great number of circuit packageswhich need to be tested it is imperative that an automated system beprovided for connecting the circuit package leads to the computer ortest sequence generator for testing. In addition, care must be exercisedto insure that no electrical signals or fields are generated by theautomated handling equipment that might interfere with or have adeleterious affect on the testing sequence.

SUMMARY OF THE INVENTION Accordingly, it is an object of this inventionto provide apparatus for sequentially and automatically making contactto integrated circuit packages.

It is another object of this invention to provide apparatus forautomatically connecting a test sequence generator to leads of a circuitpackage.

It is another object of this invention to provide a pneumaticallyoperated contactor for contacting the leads of integrated circuitpackages.

Briefly, in accordance with one embodiment of the invention anelectrical tester is connected to contactor connections of a contactor.The contactor has a track adapted to slidably receive a plurality ofcircuit packages and hasa test region to which the circuit packages aresequentially fed. The track also has a rocker member for holding acircuit package in the test region. Contact means is provided which hasa plurality of contact fingers. The contact means is movable between anengaged and a disengaged position with respect to the test regionwhereby the contact fingers make contact with the leads of theintegrated circuit package in the test region when the contact means isin the engaged position. The contact fingers are connected to thecontactor connections and thus to the tester so that a test a testsequence may be applied to an integrated circuit package in the testposition. Means is provided for moving the contact means between theengaged and disengaged positions and means is also provided foroperating the rocker member. In this manner a circuit package isreleased from the test region after a test sequence and the next of theplurality of the circuit packages moves to the test region.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side elevation partly incross section of a contactor for testing circuit packages in accordancewith this invention.

FIG. 2 is an elevation of the contactor of FIG. 1 taken along the line2-2 of FIG. 1.

FIG. 3 is an isometric view showing one form of circuit package and acarrier in which the circuit package is mounted.

FIG. .4 is a sectional view of the contactor of FIG. 1 taken along theline 4-4 in FIG. 1.

FIG. 5 is a detail view of a portion of the track of the contactor ofFIG. 1 taken along the line 5-5 of FIG. 1.

FIG. 6 is a detail of a portion of the contactor of FIG. 1 taken alongthe line 6-6 in FIG. 1.

FIG. 7 is a detail of the contact finger block holder shown in FIG. 2taken'along the line 7-7.

FIG. 8 is a pictorial view of another form of circuit package which thecontactor of FIG.- 8 is adapted to test.

FIG. 9 is a side elevational view similar to FIG. 1 and showing anotherembodiment of a contactor for testing the circuit packages illustratedin FIG. 8.

FIG. 10 is another view of the contact finger actuating assembly of thecontactor of FIG. 8.

FIG. 11 is a pneumatic circuit diagram of the pneumatic circuit of thecontactor of FIG. 1.

DESCRIPTION OF THE PREFERRED EMBODIMENTS The contactor comprising thepresent invention consists of a base 12 to which is mounted a contactoroperating air cylinder 13 and an escapement operating air cylinder 14.The base 12 has an inclined portion 12a which mounts a track 15 which isinclined at a substantial angle with respect to the horizontal andvertical region 19. The track 15 has a groove 16 and guide rails 17which are mounted to the track 15 by screws 18. The track 15 has a testregion generally indicated by reference numeral 19. The groove 16 intrack 15 is adapted to receive in end-to-end relation a plurality ofcircuit packages 20. The track 15 is inclined so that the circuitpackages slide down the enclosure defined by the groove 16 and guiderail 17 until the bottommost circuit package arrives at test region 19band is held there by a stop 21. As shown in FIG. 1 the track 15 has anupper region generally indicated by reference numeral 24 to which acircuit package storage tube 23 may be attached and a lower regiongenerally indicated by reference numeral 24 to which a circuit packagestorage tube 25 may be attached and the test region 19 is intermediatethe upper and lower regions. Suitable circuit package storage tubes arewell known in the art and may, for example, be similar to thosedescribed in US. Pat. No. 3,435,949 In accordance with this invention,the test region 19 is intermediate the upper and lower regions of thetrack 15 so that there is gravity feed of integrated circuit packagesboth into and out of the test region 19.

Contact means comprising a contact finger block holder 26 has twocontact finger blocks 27 and 28 mounted thereto by screws 29. Thecontactor finger block holder 26 is mounted in spaced relation above thetest position 19 by sliding shafls 30 which are attached to an operatingshaft 31 of the air cylinder 13 as will more fully appear hereinafter. Aspring 32 surrounds each of the sliding shafts 30 for normally holdingthe contact finger block holder 26 in a disengaged position as shown inFIG. 1. When the air cylinder 13 is actuated through its pneumatic input33 the operating shaft 31 moves downward and carries the contact fingerblock holder 26 downward also to an engaged position. An adjustable stopscrew 34 having a jamb nut 35 on the contact finger block holder 26 isadapted to abut the track 15.so as to limit the downward movement of thecontact finger blockholder 26. Each of the contact finger blocks 27 and28 comprise an insulated connector block 36 having a plurality ofconnections 37. The connections 37 connect the contactor block 36 to atest sequence generator as is more fully discussed hereinafter. Eachconnector block 36 mounts two rows of contact fingers 38 and 39 whichare separated by an insulating strip 40. These are mounted to theconnector blocks 36 by screws 41.

When the air cylinder 13 is operated so that the contact finger block 26together with contact finger blocks 27 and 28 are moved to the engagedposition, the contact fingers 38 and 39 are in contact with leads of thecircuit package which is disposed in the test region 19. A test sequencegenerator then applies signals to the circuit package 20 via connectors37 and performance of the circuit package is also sensed over theconnector 37.

In accordance with the invention the contact finger blocks 27 and 28 areoriented at approximately 45 with respect to the track 15. With thisorientation the contact fingers 38 and 39 make contact with the leads ofthe integrated circuit package at approximately 45 also. This 45orientation produces equal components of contact force both in the planeof the integrated circuit package leads and normal to the plane of theleads. This produces a scrubbing action which breaks through oxides orfilms which might be present on the leads and insures a good electricalcontact between the contact fingers and leads.

By having two rows of contact fingers 38 and 39, each of the leads of acircuit package 20 is contacted by two contact fingers.'The purpose ofthis duplication is to minimize the effect of contact resistance whilevarious parameters of the circuit package are being checked. Thisarrangement is shown in the art and is known as Kelvin contacts. Onecontact finger is referred to as power and one contact finger isreferred to as sense. When utilized in conjunction with a Kelvin bridgeerrors due to contact resistance are minimized. Continuity betweenduplicate contact fingers may also serve as an indication that goodelectrical contact is being made with a circuit package lead.

After the test sequence has been completed the air cylinder 31 isdeactuated so that the contact finger block holder 26 and contact fingerblock 27 and 28 are moved to the disengaged position shown in FIG. 1.Then air cylinder 14 is actuated through its pneumatic input 42 so thatits shaft 43 pulses upward against a rocker member 44 which is rotatedabout a pivot point package to slide down the track through the lowerregion 24 and into the circuit package storage tube 25. At the same timeit is necessary that the circuit package adjacent the test region 19 beprevented from sliding down the track until thestop 21 is again inposition so that it will cometo rest in the test region 19. Means areprovided for holding this adjacent circuit package .in position in theform of a protrusion 46 which is attached to the rocker member 44. Whenthe'rocker member 44 rotates above the pivot point 45 50 that stop 41 iswithdrawing from the track the protrusion 46 extends through an aperture47 in the track against the adjacent circuit package 20 and holds thisadjacent circuit package against the guide rails 17. so that it isprevented from moving down the track. When the air cylinder 14 isdeactuated so that its shaft 43 is withdrawn the'rocker member 44 isforced by spring action of the spring 48 to return to the position shownin FIG. 1. In this position the-stop 21 is again in position and theprotrusion 46 releases the adjacent circuit package 20 so that is mayslide down to the test region 19. t.

Referring to FIG. 3 there is shown a pictorial representation of whathas thus far been referred was the circuit packages 20. Actually,- theapparatus as shown and described in connection with FIGS. 1 and 2 isadapted to make contact to and initiate 'a test sequence of anintegrated circuit 49 having a plurality of leads 50 which may becarried in a circuit package holder 20.

FIG. 4 is a sectional view of the contactor apparatus of FIG. 1 takenalong the line 4--4 in FIG. 1 and more clearly illustrated therelationship between the air cylinder 13 and the contact finger blockholder 26. The

shaft 31 of air cylinder 13 rigidly mounts a generally rectangularmember 51. The sliding shafts 30 are also rigidly mounted to thegenerally rectangular-member 51. Thesliding shafts 30 extend throughbushings 52 mounted in the base 12 and through the springs 32 and havenecked portions 53. The contactv finger block holder 26 is rigidlyattached to the necked portions 53 of the shafts 30 by set screws 54. Ascan be seen in FIG. 5 the pivot 45 of the escapement 44 may consist of,for example, drill rod inserted in a blind hole 55 in the base 12.

In operation, a circuit package 20 which is really a circuit holder fora circuit 49 having a plurality of leads 50 is slidably received in theenclosure formed by groove 16 and track 15 and the track guide 17. Onecircuit package 20 is present in the test region 19 and abuts the stop21 of the escapement 44. Adjacent to this circuit package and extendingthrough the upper region 22 are a plurality of other integrated circuitpackages 20 in an aligned row along track 15. When the rocker member 44is pivoted the stop 21 is moved out of the way of the circuit package 20in the test region 19 and this circuit package slides down the enclosuredefined by the groove 16 and track 15 in the guide rail 17. At the sametime the protrusion 46 on rocker member 44 is brought to bear againstthe adjacent circuit package 20 and urges this circuit package againstthe guide rail 17 so as to prevent this adjacent circuit package and theother in the aligned row from also sliding down the enclosure while thestop 21 is withdrawn. When the rocker member 44 pivots back to itsoriginal position the stop 21 again appears in the groove 16; theprotrusion 46 is withdrawn from the adjacent circuit package 20 and thisadjacent circuit package 20 slides down into the test region 19.

Referring now to FIG. 6, there is shown a detailed elevational view ofthe contact finger block 28 taken along the line 6-6 in FIG. 1. Theconnector block 36 has a plurality of connections 37 which terminate incontact fingers 38. These connections 37 connect the fingers 38 with atest sequence generator 55. The contact fingers 38 as discussed beforeare adapted to contact leads of a circuit package and-the test sequencegenerator 56 is adapted to perform a plurality of tests on the circuitpackage by applying certain signals and observing certain outputs fromthe circuit package.

As shown in FIG. 7 the contact finger block holder 26 is mounted on ashaft 30 which is adapted to slide through bushings 52 of the base 12.The diagram of FIG. 7 shows the relationship between the contact fingerblock holder 26 and the base 12 when the air cylinder 13 is not operatedand the contact finger block holder 26 is in the disengaged position. Asdiscussed before, when the air cylinder 13 is operated the contactfinger block holder 26 is drawn towards the base 12. A microswitch 57 isfixedly mounted on the base 12 in the manner shown in FIG. 7. A screw 58is threaded into the contact finger block holder 26 and is adjustabletherein and has a jamb nut 59 for locking the screw 58 in a desiredposition. When the contact finger block holder 26 moves to an engagedposition the screw 58 is carried by thecontact finger block holder 26and actuates the microswitch 57. The microswitch 57 may be connected toa test sequence generator for informing the test sequence generator thatthe contact finger block holder is in the engaged position. With thecontact finger block holder 26 in the engaged position the contactfingers are in contact with the leads of a circuit package and the testsequence may begin. v

What has been described thus far is apparatus for making contact to theleads of and testing a particular embodiment of a circuit package as wasshown and described in connection with FIG. 3. As those skilled in thecircuit package art will appreciate, circuit packages do not come inonly one size and one configuration. Rather, all sizes of circuitpackages are produced and the various circuit packages may havediffering lead configurations. I.e. some may have leads, 12 leads, 14leads, etc. This invention pertains to the contacting and testing of allcircuit packages and it is obvious to those skilled in the art thatcertain minor changes should be made in the track and contact fingerconfiguration to accommodate the particular circuit packages which it isdesired to contact and test. One such circuit package which it might bedesired to test, is illustrated in FIG. 8. This circuit package 60 has aplurality of bent leads 61. Often in the manufacture of circuit packagesit is required that the leads be bent and it is desirable in someinstances to bend the leads before the circuit package is tested.

FIG. 9 is a side elevation view of apparatus for contacting and testingthe circuit package having bent leads as was illustrated in FIG. 8. Theapparatus of FIG. 9 comprises a base 62 to which is attached an aircylinder 13' having a pneumatic inlet 33 An air cylinder 14' having apneumatic inlet 42 is also attached to the base 62. A two section trackhaving an upper section 63 and a lower section 64 is also affixed to thebase 62 and is adapted to slidably receive a plurality of circuitpackages each having a plurality of bent leads 61. The track sections 63and 64 are inclined with respect to the horizontal and vertical suchthat the circuit packages 60 slide down the track section 63 and 64until the first circuit package reaches a test region generallyindicated by reference numeral 65b and abuts against a stop 66. The testregion 65b is intermediate an upper portion 65a and a lower portion 64cof the track. The stop 66 is attached to a rocker member 67 and extendsthrough an aperture 68 in the track section 63 to prevent the circuitpackages from sliding beyond the test region 65. A pair of lever arms 69are mounted for rotation about the pivot 70, which are mounted in aportion of the base 62. A pair of contact finger blocks 71 are mountedrespectively on the pair of lever arms 69. Each of the lever arms 69also has a roller 72 mounted for free rotation with respect thereto by ashaft 73. The rollers 72 bear against a cam block 74 which is rigidlyfixed to the actuating shaft 75 of the air cylinder 13. Each of thecontact finger blocks 71 has a plurality of connections 76 which extendto a test sequence generator. These connections are electricallyconnected to a plurality of contact fingers carried by each of thecontact finger blocks 71. These contact fingers are not shown in FIG. 9but are adapted upon actuation of the air cylinder 13' to be moved intoelectrical contact with the plurality of leads 61 of a contact package60 which is present in the test position 65b When the air cylinder 13'is actuated a protrusion 77 carried by the cam block 74 is adapted tocontact and actuate a microswitch 78 which is carried by the base 62.This microswitch 78 is connected to a test sequence generator (not shownin FIG. 9) and actuation of the microswitch 78 and informs the testsequence generator that the contact fingers of the contact finger blocks71 are in contact with the leads 6] of a circuit package 60 in the testregion 65b and that a test sequence may be initiated. I

After completion of a test sequence the air cylinder 13 is deactuated tomove the contact finger blocks 71 to a disengaged position. Then the aircylinder 14' which has an actuating shaft 79 is actuated. Actuation ofthe shaft 79 causes the rocker member 67 to rotate about the pivot 80.This rotation withdraws the stop 66 from in front of the contact package60 in the test region 65b and this circuit package is free to slide ondown through the lower region 650 In order to prevent adjacent circuitpackages in the upper region 65a from also sliding down through the testregion 65b without stopping at the test region a protrusion 81 is alsopro-. vided on the rocker member 67. When the rocker member 67 rotatesthis protrusion 81 is brought to bear against the circuit packageadjacent the test region 65b and holds this circuit package (along withthe other circuit packages in the aligned row) against the track section64. Then when the air cylinder 14 is deactuated so that the rockermember 67 returns to its original position with the stop 66 blocking thepath along the track sections 63 and 64, the protrusion 81 releases thisadjacent contact package so that it may slide down into the test region65. Then the air cylinder 13 is again actuated with this whole processrepeating itself.

Referring now to FIG. 10 there is shown more clearly that portion of theapparatus of FIG. 9 for contacting the leads 61 of integrated circuitpackage 60. The track section 63 has a groove 82 formed therein suchthat the circuit packages 60 fit in the groove and are adapted to slidealong it. The track section 64 serves to retain the circuit packages 60in this groove. The shaft 75 of air cylinders 13' has the cam block 74mounted thereon and this shaft 75 also extends into and is slidablyreceived by the interior of a member 84. The member 84 is mounted by abushing 85 in a portion of the base 62 and is adapted to slide back andforth in the bushing 85. The member 84* also has a guide piece 86rigidly attached thereto. The shaft 75 extends into the member 84 and iscoupled therewith by means of a spring 87. As shown in FIG. 10 each ofthe contact finger blocks 71 has a plurality of contact fingers 83 whichare adapted to move in a horizontal plane to contact the plurality ofleads 61 of a circuit package 60 when the air cylinder 13' is actuated.

When the air cylinder 13' is actuated the sequence of events is asfollows. The actuating shaft 75 is actuated which, through the couplingof spring 87 with the member 84, urges the member 84 and its attachedguide piece 86 toward the track sections 63 and 64. A

recess 88 in the guide piece 86 permits the guide piece 86 to surroundthe track' section 64 and extend between the track section 64 and theplurality of leads 61 of integrated circuit package 60. Thus the guidepiece 86 functions as a support for the plurality of leads 61 so that,they may be firmly contacted by the contact fingers 83. Further, thepositioning of the guide piece 86 between the track 64 and the pluralityof bend leads 61 serves to spread the bent leads 61 to a proper angle.

At the same time that the member 84 and its guide piece 86 are beingmoved toward the track sections 63 and 64 the cam block 74 which isattached to the shaft 75 is also being moved towards the track section63 and 64. This movement is translated by rollers 72 to rotation of thelever arms 64 about the pivots 70. This rotation causes the contactfingers 83, which are carried by the contact finger blocks 71, to movein a horizontal plane to engage and bear against the plurality of leads61 of circuit package 60. Thereafter a test sequence may be applied tothe contacts 61 through the contact fingers 83 by the connections 76which may be connected to a test sequence generator. After all testinghas been completed the air cylinder 13' is deactuated so that the leverarms 69 are rotated back to their original position, removing thecontact fingers 83 from contact with bend leads 61. A spring 89 extendsbetween the shafts 73 of the rollers 72 and functions to cause thisrotation of the lever arms 69 back to their original position. At thesame time the guide piece 86 is withdrawn from between the bent leads 61and the track section64 through the coupling of the member 84 with theshaft 75 by means of the spring 87.

A suitable pneumatic circuit for operating either the apparatus shown inFIG. 1 or the apparatus shown in FIG. 9 is logically illustrated in FIG.11. Referring to FIG. 11 a four-way two-position foot-operated springreturn valve 90 isprovided which has ports a, b, c, and d. In the normalposition port a of valve 90 is connected to port 6, and port d isconnected to port b. When, however, the foot pedal 91 is operated thevalve 90 is switched so that port a is connected to port d and port c isconnected to port b A source of air pressure 92 is connected to port aof the valve 90. Port b of valve exhausts to the atmosphere and portc ofvalve 90 is connected to port a ofa four-way two-position spring returnvalve 93 which is similar to the valve 90. Valve 93 is adapted to beoperatedby a pilot which logically is the same as the foot switch 91except that piloting air isused to shift the valve 93 as more fullydiscussed hereinafter. Port d of valve 90 is connected to a contactfinger block operating cylinder" 13 and through a flow control valve 95to the pilot 94. Port d of the valve 93 is connected to a rocker memberoperating cylinder 14. Also shown in the logical diagram of FIG. 1 1 isa microswitch 96. Microswi'tch 96 is actuated by actuation of theaircylinder 13 and informs a test sequence generator (not shown) that thisair cylinder 13 is operated and that a testing sequence may begin.

Depression of the foot pedal 91 causes the valve 90 to shift so that airpressure is supplied to the contact finger block operating cylinder 13.Thepilot 94 is also energized through the flow control valve 95 tooperate the valve 93. Since, however, valve 90 is also operated there isno air pressure output at port d thereof so that the rocker memberoperating cylinder 14 is not operated. As discussed before, motion ofthe air cylinder 13 actuates the micro switch 96 which initiates atesting sequence. After this test has been completed pressure is removedfrom the foot pedal 91 and the valve 90 switches back to its originalposition which retracts the contact finger block associated with the aircylinder 13. The valve 93 then suddenly sees air pressure at its inputport a. This energizes the air cylinder 14 which operates a rockermember such that the test circuit package falls away from the testregion. Then the pilot 94 starts to bleed through the flow control valve95 after which the valve 93 returns to its original rest position. Thisde-energizes the rocker cylinder 14, allowing the next circuit packageto fall into the test region.

We claim;

1. In contactor apparatus fortesting integrated circuit packages of thetype having a plurality of leads by use of an electrical tester whichgenerates a test sequence, an inclined track structure mounted on thebase, said base being formed to provide a track which has an upperregion, a lower region and an intermediate test region intermediate theupper and lower regions, said track being formed to slidably receive aplurality of integrated circuit packages arranged one after the other inan aligned row, said track being inclined so that said integratedcircuit packages will travel sequentially one by one under the force ofgravity through said upper, intermediate and lower regions, a rockermember carried by the track structure and movable between first andsecond positions with respect to said track for releasably engaging andholding each of the integrated circuit packages one by one in the testregion, said, rocker member including a stop which is adapted to engageand hold an integrated circuit package in the test region and preventfurther travel in the track of all succeeding integrated circuitpackages when said rocker memberis in said first position, said rockermember including a protrusion which in the second position of Saidrocker member is adapted to engage the next succeeding integratedcircuit package following the integrated circuit package in the testregion to retain it and the following integrated circuit packages whenthe integrated circuit package in the test region is released; contactmeans having a plurality of contact fingers, operative means for movingsaid contact means so that said contact fingers are moved betweenengaged and disengaged positions with respect -to the leads of anintegrated circuit package held in said test region, and furtheroperative means for causing said rocker member to momentarily move fromsaid first to said second position to release an integrated circuitpackage after it has been disengaged by the contact fingers and topermit it to travel down the track through the lower region and toengage and hold the next succeeding integrated circuit package.

2. Contactor apparatus as in claim 1 together'with first and secondstorage tubes for carrying integrated circuit packages in rows with oneintegrated circuit package behind another, said track structureincluding means at each end of the track mating with one of said tubeswhereby said first tube is mounted on the upper end of the trackstructure and said second tube is mounted on the lower end of the trackstructure with the tubes in axial alignment with the track so thatintegrated circuit packages are gravity fed directly from the firststorage tube into said track through said test region and from saidtrack directly into the second storage tube.

3. Contactor apparatus as in claim 1 wherein said track includes firstand second apertures adjacent either side of said test region,respectively said rocker member including a stop adapted to extendthrough said first aperture in the first position of the rocker memberand engage and hold an integrated circuit package in the test region andprevent further travel in the track of all succeeding integrated circuitpackages said rocker member also including a protrusion adapted toextend through said second aperture in the second position of the rockermember and engage the next succeeding integrated circuit packagefollowing the integrated circuit packages when the integrated circuitpackage in the test region is released, spring means yieldably urgingsaid rocker member to the first position of said rocker member, andactuating means for moving said rocker member to the second position.

4. In contactor apparatus for testing integrated circuit packages of thetype having a plurality of leads by use of an electrical tester whichgenerates a test sequence, a base, a track structure mounted on saidbase and forming a track having an axis which is inclined from thevertical and the horizontal at a substantial angle, said track beingformed so that it is adapted to slidably receive a plurality ofintegrated circuit packages whereby the integrated circuit packages arealigned in a row one behind the other, said track having an upperregion, a lower region and an intermediate test region intermediate saidupper and lower regions, said track being inclined at an angle so thatsaid integrated circuit packages are gravity fed one by one through saidupper region through said test region and then through said lowerregion, a rocker member movable between first and second positions withrespect to said track, said rocker member including a stop which in thefirst position of said rocker member is adapted to engage and hold anintegrated circuit package in the test region and to prevent furthertravel in the track of all succeeding integrated circuit packages, saidrocker member including a protrusion which in the second position ofsaid rocker member is adapted to engage the next succeeding integratedcircuit package following the integrated circuit package in the testregion to retain it and the following integrated circuit packages whenthe integrated circuit package in the test region is released, contactmeans mounted on said base in spaced relationship to said track andhaving a plurality of contact fingers, operative means for moving saidcontact means so that said contact fingers are moved between engaged anddisengaged positions with respect to the leads of an integrated circuitpackage held in said test region, means for momentarily actuating saidrocker member to the second position whereby an integrated circuitpackage after it has been disengaged by the contact fingers is releasedto travel down the track through the lower region, but said protrusionengages the next succeeding integrated circuit package following theintegrated circuit package in the test region to retain it and thefollowing integrated circuit packages when the integrated circuitpackages in the test region is released, spring means for yieldablyurging said rocker member to the first position whereby the nextsucceeding integrated circuit package is then held in the test region.

5.; Contactor apparatus as in claim 4 wherein said track comprises agrooved member and a guide member for retaining integrated circuitpackages therebetween, said grooved member having a first aperturebetween the test region and the lowerregion of said track through whichsaid stop portion of said rocker member is adapted to extend when saidrocker member is in the first position, said grooved member having asecond aperture in said rocker member is adapted to extend when saidrocker member is in said second position.

6. Contactor apparatus as in claim 5 for contacting integrated circuitpackages of the type having a plurality of straight leads wherein saidcontact includes two contact finger blocks, each contact finger blockhaving a plurality of fingers extending along the axis of said track andadapted to move in a vertical plane to engage the plurality of leads ofan integrated circuit package in said test region when said contactmeans is moved to an engaged position.

7. Contactor apparatus as in claim 5 for contacting integrated circuitpackages of the type having a plurality of bent leads wherein saidcontact means includes two contact finger blocks, each contact fingerblock having a plurality of fingers extending in a plane perpendicularto the axis of said track and adapted to move in a horizontal plane toengage the plurality of leads of an integrated circuit package in saidtest region where said contact means is moved to an engaged position.

1. In contactor apparatus for testing integrated circuit packages of thetype having a plurality of leads by use of an electrical tester whichgenerates a test sequence, an inclined track structure mounted on thebase, said base being formed to proVide a track which has an upperregion, a lower region and an intermediate test region intermediate theupper and lower regions, said track being formed to slidably receive aplurality of integrated circuit packages arranged one after the other inan aligned row, said track being inclined so that said integratedcircuit packages will travel sequentially one by one under the force ofgravity through said upper, intermediate and lower regions, a rockermember carried by the track structure and movable between first andsecond positions with respect to said track for releasably engaging andholding each of the integrated circuit packages one by one in the testregion, said rocker member including a stop which is adapted to engageand hold an integrated circuit package in the test region and preventfurther travel in the track of all succeeding integrated circuitpackages when said rocker member is in said first position, said rockermember including a protrusion which in the second position of saidrocker member is adapted to engage the next succeeding integratedcircuit package following the integrated circuit package in the testregion to retain it and the following integrated circuit packages whenthe integrated circuit package in the test region is released; contactmeans having a plurality of contact fingers, operative means for movingsaid contact means so that said contact fingers are moved betweenengaged and disengaged positions with respect to the leads of anintegrated circuit package held in said test region, and furtheroperative means for causing said rocker member to momentarily move fromsaid first to said second position to release an integrated circuitpackage after it has been disengaged by the contact fingers and topermit it to travel down the track through the lower region and toengage and hold the next succeeding integrated circuit package. 2.Contactor apparatus as in claim 1 together with first and second storagetubes for carrying integrated circuit packages in rows with oneintegrated circuit package behind another, said track structureincluding means at each end of the track mating with one of said tubeswhereby said first tube is mounted on the upper end of the trackstructure and said second tube is mounted on the lower end of the trackstructure with the tubes in axial alignment with the track so thatintegrated circuit packages are gravity fed directly from the firststorage tube into said track through said test region and from saidtrack directly into the second storage tube.
 3. Contactor apparatus asin claim 1 wherein said track includes first and second aperturesadjacent either side of said test region, respectively said rockermember including a stop adapted to extend through said first aperture inthe first position of the rocker member and engage and hold anintegrated circuit package in the test region and prevent further travelin the track of all succeeding integrated circuit packages said rockermember also including a protrusion adapted to extend through said secondaperture in the second position of the rocker member and engage the nextsucceeding integrated circuit package following the integrated circuitpackages when the integrated circuit package in the test region isreleased, spring means yieldably urging said rocker member to the firstposition of said rocker member, and actuating means for moving saidrocker member to the second position.
 4. In contactor apparatus fortesting integrated circuit packages of the type having a plurality ofleads by use of an electrical tester which generates a test sequence, abase, a track structure mounted on said base and forming a track havingan axis which is inclined from the vertical and the horizontal at asubstantial angle, said track being formed so that it is adapted toslidably receive a plurality of integrated circuit packages whereby theintegrated circuit packages are aligned in a row one behind the other,said track having an upper region, a lower region and an intermediatetest region intermediate said upper and lower regions, said track beinginclined at an angle so that said integrated circuit packages aregravity fed one by one through said upper region through said testregion and then through said lower region, a rocker member movablebetween first and second positions with respect to said track, saidrocker member including a stop which in the first position of saidrocker member is adapted to engage and hold an integrated circuitpackage in the test region and to prevent further travel in the track ofall succeeding integrated circuit packages, said rocker member includinga protrusion which in the second position of said rocker member isadapted to engage the next succeeding integrated circuit packagefollowing the integrated circuit package in the test region to retain itand the following integrated circuit packages when the integratedcircuit package in the test region is released, contact means mounted onsaid base in spaced relationship to said track and having a plurality ofcontact fingers, operative means for moving said contact means so thatsaid contact fingers are moved between engaged and disengaged positionswith respect to the leads of an integrated circuit package held in saidtest region, means for momentarily actuating said rocker member to thesecond position whereby an integrated circuit package after it has beendisengaged by the contact fingers is released to travel down the trackthrough the lower region, but said protrusion engages the nextsucceeding integrated circuit package following the integrated circuitpackage in the test region to retain it and the following integratedcircuit packages when the integrated circuit packages in the test regionis released, spring means for yieldably urging said rocker member to thefirst position whereby the next succeeding integrated circuit package isthen held in the test region.
 5. Contactor apparatus as in claim 4wherein said track comprises a grooved member and a guide member forretaining integrated circuit packages therebetween, said grooved memberhaving a first aperture between the test region and the lower region ofsaid track through which said stop portion of said rocker member isadapted to extend when said rocker member is in the first position, saidgrooved member having a second aperture in said rocker member is adaptedto extend when said rocker member is in said second position. 6.Contactor apparatus as in claim 5 for contacting integrated circuitpackages of the type having a plurality of straight leads wherein saidcontact includes two contact finger blocks, each contact finger blockhaving a plurality of fingers extending along the axis of said track andadapted to move in a vertical plane to engage the plurality of leads ofan integrated circuit package in said test region when said contactmeans is moved to an engaged position.
 7. Contactor apparatus as inclaim 5 for contacting integrated circuit packages of the type having aplurality of bent leads wherein said contact means includes two contactfinger blocks, each contact finger block having a plurality of fingersextending in a plane perpendicular to the axis of said track and adaptedto move in a horizontal plane to engage the plurality of leads of anintegrated circuit package in said test region where said contact meansis moved to an engaged position.